MEMUNITY Workshop

Reliability, Testing, and Characterization of Micro Systems
Sep 15, 2010
Dortmund, Germany
The workshop is organized by MEMUNITY, an open community of companies, institutes and universities operating in the field of microsystems technology dedicated to promoting wafer-level test techniques for MEMS devices.

To register, please send an email with the names of all participants and company contact information to info@memunity.org by August 31st.

The event is free of charge.

Links

further information

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